Vacuum Benchtop Probe Station
Tabletop design with small footprint integrate with modern instruments and benches
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-190°C - 1000°C depending on model
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Fits 10 mm - 300 mm wafers and devices
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Sealed chamber with gas purging or vacuum capability
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4 independent electrical probes with remote positioning
MODELS
- TP102V-PS Series operates from -40°C to 180°C with thermoelectric cooling and heating and vacuum options
- HCP422V-PS Series operates from -190°C (with liquid N2 cooling) to 400°C (with resistive heating) with vacuum
- HP1000V-PS Series operates from 35°C to 1000°C with resistive heating only, and supports vacuum
- CUSTOM Series available to achieve lower and higher temperatures and custom features for any application
STRUCTURAL FEATURES
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Sample Area |
Fits 10 mm-300 mm wafers and devices |
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Chamber Height |
6 mm |
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Probe Positioning |
XYZ micropositioners remotely manipulate probes within sealed sample chambers with 20 mm fine travel |
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Atmosphere Control |
Gas purging or vacuum capability to control humidity, condensation, and oxidation |
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Frame Cooling |
Integrated frame cooling via hose barb ports with optional chiller system |
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Frame Dimensions |
1060 mm x 600 mm x 213.2 mm |
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Weight |
20 kg, aluminum or stainless steel options |
OPTICAL FEATURES
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Optical Access |
Reflection capability via large window |
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Optical Windows |
Removable and exchangeable windows permit full-spectrum transparency |
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Minimum Objective Working Distance |
25 mm |
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Top Window |
50 mm diameter |
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Top Viewing Angle |
±40° from normal |
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Window Defrost |
Integrated external window defrost |
ELECTRICAL FEATURES
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Electrical Probes |
Standard tungsten-rhenium DC probes with other probe options available |
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Probe Positioning |
XYZ micropositioners remotely manipulate probes within sealed sample chambers with 20 mm fine travel |
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Connectors |
Coaxial, floating, or triaxial BNC connectors |
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Sample Surface |
Grounded, floating, or triaxial options |
THERMAL FEATURES
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Temperature Control |
mK2000 with programmable precision LVDC PID method to minimize electrical noise |
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Thermal Block |
Aluminum, Silver, or Ceramic options for superior thermal uniformity |
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Temperature Resolution |
0.01°C (RTD) or 0.1°C (Themocouple ) |
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Temperature Stability |
±0.05°C at 100°C |
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Power Supply |
115 V or 230 V depending on region |
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Software |
Windows software to record and export temperature-time data |
APPLICATIONS
- Characterize electrical behavior of thin films, 2D materials, nanomaterials, and molecular/organic electronic devices
- Electrically grounded, floating, or triaxial options for the thermal block surfaces and triaxial BNC connectors
- DC electrical probe options in tungsten-rhenium, beryllium-copper, or other materials
- Remotely manipulate probes in sealed chambers with XYZ positioning
- Test components of wafers, semiconductor devices, integrated circuits, printed circuit boards, photovoltaics, LC’s, and LED’s
- Measure IV and CV characteristics, breakdown voltage, leakage current, resistance, dielectric strength, and diode efficiency
