- Tabletop design with small footprint integrate with modern instruments and benches
 - -190°C - 1000°C depending on model
 - Fits 10 mm - 300 mm wafers and devices
 - Sealed chamber with gas purging capability
 - 4 independent electrical probes with remote positioning
 
THERMAL FEATURES
| 
			 Temperature Control  | 
			
			 mK2000 with programmable precision LVDC PID method to minimize electrical noise  | 
		
| 
			 Thermal Block  | 
			
			 Aluminum, Silver, or Ceramic options for superior thermal uniformity  | 
		
| 
			 Temperature Resolution  | 
			
			 0.01°C (RTD) or 0.1°C (Themocouple )  | 
		
| 
			 Temperature Stability  | 
			
			 ±0.05°C (above 25°C), ±0.1°C (below 25°C)  | 
		
| 
			 Power Supply  | 
			
			 Universal power input  | 
		
| 
			 Software  | 
			
			 Windows software to record and export temperature-time data  | 
		
ELECTRICAL FEATURES
| 
			 Electrical Probes  | 
			
			 Standard tungsten-rhenium DC probes with other probe options available  | 
		
| 
			 Probe Positioning  | 
			
			 XYZ micropositioners remotely manipulate probes within sealed sample chambers with 20 mm fine travel  | 
		
| 
			 Connectors  | 
			
			 Coaxial, floating, or triaxial BNC connectors  | 
		
| 
			 Sample Surface  | 
			
			 Grounded, floating, or triaxial options  | 
		
OPTICAL FEATURES
| 
			 Optical Access  | 
			
			 Reflection capability via large window  | 
		
| 
			 Optical Windows  | 
			
			 Removable and exchangeable windows permit full-spectrum transparency  | 
		
| 
			 Minimum Objective Working Distance  | 
			
			 25 mm  | 
		
| 
			 Top Window  | 
			
			 50 mm diameter  | 
		
| 
			 Top Viewing Angle  | 
			
			 ±40° from normal  | 
		
| 
			 Window Defrost  | 
			
			 Integrated external window defrost  | 
		

STRUCTURAL FEATURES
| 
			 Sample Area  | 
			
			 Fits 10 mm-50x50mm for standard station, up to 300 mm for custom  | 
		
| 
			 sample Height  | 
			
			 6 mm  | 
		
| 
			 Probe Positioning  | 
			
			 XYZ micropositioners remotely manipulate probes within sealed sample chambers with 20 mm fine travel  | 
		
| 
			 Atmosphere Control  | 
			
			 Gas purging to control humidity, condensation, and oxidation  | 
		
| 
			 Frame Cooling  | 
			
			 Integrated frame cooling via hose barb ports with optional chiller system  | 
		
| 
			 Frame Dimensions  | 
			
			 1060 mm x 600 mm x 213.2 mm  | 
		
| 
			 Weight  | 
			
			 20 kg, aluminum or stainless steel options  | 
		
MODELS
• TP102SG-PS Series operates from -40°C to 180°C with thermoelectric cooling and heating and gas purging
• HCP622G-PS Series operates from -190°C (with liquid N2 cooling) to 600°C (with resistive heating) with gas purging
• HP1000G-PS Series operates from 35°C to 1000°C with resistive heating only, and supports both gas purging
• CUSTOM Series available to achieve lower and higher temperatures and custom features for any application, wafer size upto 300mm
APPLICATIONS
• Characterize electrical behavior of thin films, 2D materials, nanomaterials, and molecular/organic electronic devices
• Electrically grounded, floating, or triaxial options for the thermal block surfaces and triaxial BNC connectors
• DC electrical probe options in tungsten-rhenium, beryllium-copper, or other materials
• Remotely manipulate probes in sealed chambers with XYZ positioning
• Test components of wafers, semiconductor devices, integrated circuits, printed circuit boards, photovoltaics, LC’s, and LED’s
• Measure IV and CV characteristics, breakdown voltage, leakage current, resistance, dielectric strength, and diode efficiency











