General-Purpose X-ray Diffractometer DRON-7M

XRD

General-Purpose X-ray Diffractometer DRON-7M

X-선 회절분석기 DRON-7M은 광범위한 분말 시료의 회절 분석이 가능한 모델이며, 방사선 안전 검사와 설치가 간단한 제품입니다. 본 제품은 축을 중심으로 샘플을 독립적으로 회전시키고 검출기를 제어하므로, 단결정 분석을 위한 기기로 사용하실 수 있습니다.

Methods of X-ray diffraction analysis implemented in diffractometers are as follows:

결정질 물질의 상 (미네랄) 조성에 대한 정성 및 정량 분석
온도, 대기압 (진공), 기체 매질 조성과 같은 환경 변화를 고려한 분석
단결정 (single-crystal)의 orientation 측정
다결정 (polycrystalline)의 물성과 응력 상태 측정
결정의 다양한 구조적 특성 측정은 물론, 원자구조 연구

Process Diagram

Software

Data processing - DrWin

Processing of diffraction pattern or selection
Background approximation (by polynomial or user curve)
Separation of K-doublets
Peak seach and determination of their anglular positions
Approximation of reflection profiles by pseudo-Voigt function (for the entire array or independently for each peak)
Calculation of peak heights and their integral intensities
Calculation of FWHM of reflections

Quantitative phase analysis - Quan

Overall analysis of multicomponent mixture
Analysis of n-component system
Analysis of sample with known mass absorption coefficient
Method of internal standard
Method of Reference Intensity Ratios (RIR’s)
Method of additives
Method of reduction

Calculation of average size of coherent domains and of microstrains - Size&Strain

Calculation of size of coherent domains and microstrains by the method of second central moments
Calculation of instrumental line broadening
Application of absorption correction to the samples with another composition

Calculation of theoretical diffraction pattern - TheorPattern

Simulation of diffraction patterns of multicomponent mixtures from structural data
Account for of instrumental factor
Account for texture and crystalline size for each component
Comparison of simulated and measured diffraction patterns
Integrated package of geometrical crystallography

Auto indexing of Powder Diffraction Pattern - Ind

Determination of Bravais lattice type
Choice of unit cell
Computation of Miller indices for selected lines
Bar graph of input diffraction pattern

Full profile analysis by Rietveld method - Rietveld

Refinement of crystal structures from X-ray powder diffraction data of single crystalline phases and mixtures
Calculation of polynominal and physical background
Independent refinement of U, V, W, X, Y profile for different phases and for different groups of reflections
Refinement of unit cell parameters, atomic and thermal parameters, occupations of atomic positions for each phase
Choice of refinement strategy
Control of Rrefinement conditions
Calculation of five R-factors

Residual stress analysis - MacroStress

Calculation of peak angular position from center of gravity or from peak topapex
Correcting of correction matrix
Calculation of linear, planar and volumetric stresses
Calculation of stress deviations

High temperature-X-ray diffraction - Thermo

3D-imaging of measured data in “diffraction angle - intensity - temperature” co-ordinates
Calibration of the measured data set by internal or external standard
Refinement of unit cell parameters of the calibrated data set
Determination of phase transition points
Determination of thermal expansion coefficients (TEC) in different directions and thermal deformation tensors
Building of TEC figures

Qualitative phase analysis and access to the Ppowder Diffraction File database - Retrieve and Search-Match

Use of PDF-2/PDF-4 database of International Center of Diffraction< Data (ICDD) for qualitative analysis
Automatic or manual search algorithm
Creation of user subbases for search facilitation
Addition of user standards into subbases
Qualitative phase analysis by different criteria, bases (subbases)
Analysis of lines matched by angular position and intensity
Quantitative phase analysis by Reference Intensity Ratios (RIR’s) method
Access to the data base including search by selected criteria

Technical data

Goniometer

Type		Horizontal 2θ-θ
X-ray optics		Bragg-Brentano/Debye-Scherrer/parallel-beam
Raduis R, mm		200 mm
Angular range	2θ	from -100 to 165 deg.
	θ	from -180 to 180 deg.
Scanning modes		stepped/continuous
Scanning technique:		θ-2θ, 2θ, θ, 2θ-Ω
Min. scanning step		0.001 deg.
Scanning rate		from 0.1 to 50 deg./min
Reproducibility		±0.0025 deg.
Travelling speed		720 deg/min

Advanced options

Sample stages, Attachments and chambers
	Stage for bulk samples to install samples with thickness of up to 10 mm and length of up to 100 mm.
	Stage for cylindrical samples (capillaries) of 0.1-1.0 mm in diameter to for measure patterns in Debye-Sherrer geometry.
	Two-axis χ,φ attachment for analysis of textures and residual stresses in polycrystalline samples and for the determination of crystal orientation up to 28 mm in diameter.
	High-temperature chambers (up to 1200, 1600, 2000 and 2300°С) for in situ tracing of phase transformation and chemical reactions in changeable environment.
	The vacuum system
	Autosampler for 6 positions.
Registration systems
	X-ray registration system based on linear position-sensitive stripped detector.
	X-ray registration system based on solid-state energy-dispersive Peltier-cooled detector.
X-ray optical elements
	Versatile primary beam monochromator.
	Versatile diffracted beam monochromator.
	Different types of crystals-monochromators (plane, asymmetric, curved, channel-cut) from different materials.
	One-dimensional parabolic mirror for parallel-beam geometry.
Other options
	Closed cooling system (chiller).
	BSV- 27...29 and BSV-40...42 X-ray tubes with different of focus sizes and different anode materials.
	Soller slits with divergence of 1.5 to 4 degrees for collimation of diffracted beam when point or position-sensitive detectors are used.
	β-filters for monochromatization of various X-ray radiations when point or position-sensitive detectors are used.

Scope of application

General-Purpose X-ray Diffractometer DRON-7M

Detector type		Scintillation NaI (Tl)
Counting rate		up to 500,000 imp/sec

Power supply		3 kW
Voltage		0-60 KV
Current		0-80 mA
Anode current and voltage stability		0.01 %
Cooling		air cooling

Type		2,5BSV-27Cu
Focus		10 mm х 1.6 mm
Cooling		water cooling (3 l/min)

Installation area		5 m²
Power consumption,		5.5 kVA
Weight		520 kg
Power		Single-phase 220 V /50 Hz
Overall dimensions		1050 х 1100 х 1800 (L х W х H), mm

Qualitative & Quantitative Analyzer

General-Purpose X-ray Diffractometer DRON-7M

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