General-Purpose X-ray Diffractometer DRON-8

XRD

General-Purpose X-ray Diffractometer DRON-8

Vertical θ- θ goniometer와 수평 샘플 포지셔너를 장착한 범용 X-선 회절분석기 DRON-8을 사용하면 무거운 대형 크기의 샘플과 형태가 불규칙한 샘플의 phase composition 및 structural state, orientation에 대한 X-선 회절 분석을 수행 할 수 있습니다. 범용 X-선 회절은 광범위한 분말 회절 분석이 가능하며, 검출기와 시료 회전을 독립적으로 제어함으로써, 단결정의 분석에 사용됩니다

Methods of X-ray diffraction analysis implemented in diffractometers are as follows:

DRON-8은 DRON-7 모델에 비해 높은 기술적 특성과 운영 특성을 가지고 있습니다. Goniometer는 180-250 mm의 radius 변경이 가능하며, 0.001도 이하의 각도 위치 재현성을 갖고, sample plane은 자동으로 조정됩니다. X-ray tube와 검출기의 독립적이고 동기화된 구동을 위해 6가지 알고리즘으로, 알려진 모든 XRD 분석을 수행합니다. DRON-7에는 여러 가지 옵션을 제공하고 있습니다. 대형 샘플 (xy-scanning, z-moving, φ-rotation) 측정을 위한 4 축 홀더를 추가하면 plate, 단결정 및 여러가지 형태의 다양한 샘플에 대해 상 조성 분석과 구조 상태 및 결정학적 축에 관련된 표면 배향의 제어를 위한 분석이 가능합니다.

Process Diagram

Software

Data processing - DrWin

Processing of diffraction pattern or selection
Background approximation (by polynomial or user curve)
Separation of K-doublets
Peak seach and determination of their anglular positions
Approximation of reflection profiles by pseudo-Voigt function (for the entire array or independently for each peak)
Calculation of peak heights and their integral intensities
Calculation of FWHM of reflections

Quantitative phase analysis - Quan

Overall analysis of multicomponent mixture
Analysis of n-component system
Analysis of sample with known mass absorption coefficient
Method of internal standard
Method of Reference Intensity Ratios (RIR’s)
Method of additives
Method of reduction

Calculation of average size of coherent domains and of microstrains - Size&Strain

Calculation of size of coherent domains and microstrains by the method of second central moments
Calculation of instrumental line broadening
Application of absorption correction to the samples with another composition

Calculation of theoretical diffraction pattern - TheorPattern

Simulation of diffraction patterns of multicomponent mixtures from structural data
Account for of instrumental factor
Account for texture and crystalline size for each component
Comparison of simulated and measured diffraction patterns
Integrated package of geometrical crystallography

Auto indexing of Powder Diffraction Pattern - Ind

Determination of Bravais lattice type
Choice of unit cell
Computation of Miller indices for selected lines
Bar graph of input diffraction pattern

Full profile analysis by Rietveld method - Rietveld

Refinement of crystal structures from X-ray powder diffraction data of single crystalline phases and mixtures
Calculation of polynominal and physical background
Independent refinement of U, V, W, X, Y profile for different phases and for different groups of reflections
Refinement of unit cell parameters, atomic and thermal parameters, occupations of atomic positions for each phase
Choice of refinement strategy
Control of Rrefinement conditions
Calculation of five R-factors

Residual stress analysis - MacroStress

Calculation of peak angular position from center of gravity or from peak topapex
Correcting of correction matrix
Calculation of linear, planar and volumetric stresses
Calculation of stress deviations

High temperature-X-ray diffraction - Thermo

3D-imaging of measured data in “diffraction angle - intensity - temperature” co-ordinates
Calibration of the measured data set by internal or external standard
Refinement of unit cell parameters of the calibrated data set
Determination of phase transition points
Determination of thermal expansion coefficients (TEC) in different directions and thermal deformation tensors
Building of TEC figures

Qualitative phase analysis and access to the Ppowder Diffraction File database - Retrieve and Search-Match

Use of PDF-2/PDF-4 database of International Center of Diffraction< Data (ICDD) for qualitative analysis
Automatic or manual search algorithm
Creation of user subbases for search facilitation
Addition of user standards into subbases
Qualitative phase analysis by different criteria, bases (subbases)
Analysis of lines matched by angular position and intensity
Quantitative phase analysis by Reference Intensity Ratios (RIR’s) method
Access to the data base including search by selected criteria

Technical data

Goniometer

Type		Vertical θ- θ
X-ray optics		Bragg-Brentano/Debye-Scherrer/parallel-beam
Raduis R		180-250 mm
Angular range, deg.	2θ	from -10 to 165 (up to 169 at R=200 mm)
	θ_D	from -5 to 165
	θ_F	from -5 to 95
Scanning modes		stepped/continuous
Scanning technique:		θ-θ, θ, Ω, 2θ-Ω, Ѱ, sin²Ѱ
Min. scanning step		0.0005 deg.
Scanning rate		from 0.1 to 50 deg./min
Reproducibility		±0.001 deg.
Travelling speed		600 deg/min

Advanced options

Sample stages, Attachments and chambers
	Four-axis xyzφ stage for large samples to study bulk objects (up to 300 mm diam., up to 250 mm height and up to 50 kg weight) including oddly shaped samples with uneven surfaces, as well as for mapping of phase composition and structural characteristics across sample surface.
	Two-axis χ,φ attachment for analysis of textures and residual stresses in polycrystalline samples and for the determination of crystal orientation up to 28 mm in diameter.
	High-temperature chambers (up to 1200, 1600, 2000 and 2300°С) for in situ tracing of phase transformation and chemical reactions in changeable environment.
	The vacuum system
	Autosampler for 6 positions.
Registration systems
	X-ray registration system based on linear position-sensitive stripped detector.
	X-ray registration system based on solid-state energy-dispersive Peltier-cooled detector.
X-ray optical elements
	Versatile primary beam monochromator.
	Versatile diffracted beam monochromator.
	Different types of crystals-monochromators (plane, asymmetric, curved, channel-cut) from different materials.
	One-dimensional parabolic mirror for parallel-beam geometry.
	а 4-bounce channel-cut monochromator (4 x Ge 220) on a primary beam singles out a monochromatic Kα1 line with anglular resolution of about 6” for high resolution geometry.
	Channel-cut monochromator with variable (from 1 to 5) multiplicity on the primary beam singles out monochromatic Kα or Kα1 line . It is used for SAXS measurements and reflectometry.
Other options
	Closed cooling system (chiller).
	BSV- 27...29 and BSV-40...42 X-ray tubes with different of focus sizes and different anode materials.
	Soller slits with divergence of 1.5 to 4 degrees for collimation of diffracted beam when point or position-sensitive detectors are used.
	β-filters for monochromatization of various X-ray radiations when point or position-sensitive detectors are used.

Scope of application

General-Purpose X-ray Diffractometer DRON-8

Detector type		Scintillation NaI (Tl)
Counting rate		up to 500,000 imp/sec

Power supply		3 kW
Voltage		0-60 KV
Current		0-80 mA
Anode current and voltage stability		0.01%
Cooling		air cooling

Type		2,5BSV-27Cu
Focus		10 mm х 1.6 mm
Cooling		water cooling (3 l/min)

Installation area		5 m²
Power consumption		5.5 kVA
Weight		750 kg
Power		Single-phase 220V /50 Hz
Overall dimensions		1350 х 1200 х 2250 (L х W х H), mm

Qualitative & Quantitative Analyzer

General-Purpose X-ray Diffractometer DRON-8

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