XRD-2700 시리즈 X-선 회절 분석기는 재료 연구 및 산업 제품 분석을 위해 설계되었으며 종래의 분석 기술과 특수 목적 측정 기법을 결합한 완벽한 제품입니다.

• The perfect combining with hardware and software system, satisfy with the requirement of different application field academician, scientific research.
• High precision diffraction angle measuring system, obtaining more accurate measurement results.
• High stability X-ray generator control system, and get more stable repeatable measurement precision.
• Various functional accessories meet the requirement of different testing purposes.
• Program operation, integrated structure design, easy to operate, more beautiful appearance of the instrument;
• X-ray diffractometer is a kind of universal testing instrument for revealing crystal structure and chemical information of material:
• One and many phase identification of unknown sample
• Quantitative analysis of the phase in the mixed sample
• Crystal structure analysis (Rietveld structure analysis)
• The crystal structure change (high temperature and low temperature condition) of the abnormal condition.
• Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density.
• Analysis of micro area sample.
• Texture and stress analysis of metallic materials

Application

본 제품은 금속 재료 및 유.무기 재료, 복합 재료, 나노 소자, 초전도 소재에 적용 할 수 있습니다. 이들 재료 상태는 분말 또는 블록, 박막 및 마이크로 영역의 마이크로 샘플 일  수 있습니다.  본 제품은 점토 광물, 시멘트 건축 자재, 환경 먼지, 화학 제품, 약물, 석면, 암석, 폴리머 및 다양한 연구 분야에서 널리 사용됩니다.

Functions

• Indicate the material’s crystal structure and chemical information;
• Identify one or multiple phases in an unknown sample;
• Quantitative analysis of the known phase in the mixed sample;
• Crystallographic structural analysis (Rietveld structure analysis);
• Measure the changes of crystal structure under normal conditions (low or high temperature);
• Film sample analysis, including thin film phase, multi-films thickness, surface roughness and electric density;
• Micro-area sample analysis;
• Microstructure and stress analysis on metal material.Optional Multi-sample holder

Advantages

• Base on θ-θ optical design it is easy for sample preparation and accessories installation;
• Adopting metal ceramic X-ray tube improves the operating power of the XRD greatly;
• Closed proportional counter is durable and maintenance free;
• Silicon Drift Detector has superior angular resolution and energy resolution, the measuring speed can improve more than 3 times;
• Various accessories can meet different analysis aims; Various function accessories automatic identification;
• Base on modular design (plug and play configuration), operator can correctly use XRD without adjusting optical system.

Function of Software

• Basic data processing (peak seeking, smoothing, background deduction, peak fitting, peak amplification, spectra comparison, Kα1 and α2K stripping, diffractive line indexing, etc.)
• Quick quantitative analysis for samples without and reference parameters;
• Size measurement of crystal grain;
• Crystal structure analysis (parameter measurement and refining of unit cell);
• Macroscopic stress measurement and micro stress calculation; 2d and 3d display of multiple drawings;
• Diffraction peak image cluster analysis;
• Diffraction data half-peak width correction curve;
• Diffraction data Angle deviation correction curve;
• General quantitative analysis Based on Rietveld;

Multi-function sample holder

With the deepening of material analysis, we want to do performance analysis by XRD on more materials, such as slabs, bulk material and film on matrix. Installing a multi-function sample holder on the goniometer can realize texture, macro-stress and film inner structure measurements. Each function has its own calculating software.

➢Texture measurement and evaluation on rolling plate (AL, Fe, Copper plate, etc)
➢Residual stress measurement on metal, ceramic, etc
➢Crystal preferred orientation evaluation on film sample
➢Orientation measurement on macromolecular compound
➢Multilayer film, oxidation film and nitride film analysis on the metals and non-metallic substrate

Multi-function sample holder is used for structure measurement, after calculation, it will draw out pole figure, inverse pole figure and ODF figure. Multi-function sample holder is used for macroscopic stress measurement. Set several Psi angles between -30-90° to make the sample tilt corresponding angles. At different Psi angles, it can measure angle deviation of specific crystal plane respectively and figure out the macro-stress of the sample.

Specification