특수한 파장분산형 XRF분석기 (WD-XRF)는 Cochois 방식을 기반으로하여 화학 원소 U, Th, Mo, Au, W, Tl, As, Pb는 물론 technogenic field를 개발 시 광석 및 암석의 여러가지 원소를 매우 정밀하게 검출하도록 고안되었습니다.
Principle of analyzer operation is based on the excitation of the fluorescent radiation of sample atoms being under examination by radiation coming from an X-ray tube. Spectrum decomposition of the fluorescence radiation is performed according to Cauchois method. The fluorescence radiation focused by analyzing crystal and standard line are marked on Rowland focal circle. Then, they are recorded by X-ray radiation detector in turn. The intensity of the fluorescent irradiation with a particular wavelength is directly proportional to the chemical element concentration in the material under examination.
Scope of application : Mining Industry
Process Diagram
Technical data
|
Range of determined elements |
from Сo (27) to U (92) |
|---|---|
|
Spectral resolution (half-width of a line U Lа1), eV, max |
40 eV |
|
Concentration range, % |
from 10-4 to 100 % |
|
Limits of basic relative error, % |
0.5 % |
|
Limit of U(92) detection in 100 sec, max, ppm |
1.5 ppm |
|
Number of samples loaded simultaneously, pcs |
30 pcs |
|
Power consumption |
4.6 kW |
|
Weight |
max. 400 kg |
|
Overall dimensions (L х W х H) |
1300 mm х 1150 mm х 850 mm |
Specialized wavelength-dispersive XRF analyzer based on the Cochois scheme is designed for high-precision determination of chemical elements U, Th, Mo, Au, W, Tl, As, Pb as well as other elements in ores, rocks and when developing the technogenic fields.
