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Thermal Properties Analyzer

Thermal Conductivity (Lambda), Ash Fusion, Thermal Screening, Microscopic Hot/Cold Stage, Wafer Chuck, Thermal Plate, Thermal Probe Station

PSM MINIATURE ANALYTICAL PROBE STATION


  • Compact & affordable design for research laboratory
  • Up to 6 inch wafer testing with 50um electrodes / PAD probes
  • Precision linear screw drives with zero back lash
  • LD/LED/PD light intensity / wavelength testing
  • IV/CV characteristic materials and device testing

 

SPECIFICATIONS

Model

SM-4

SM-6 MINI

SM-6

Dimensions

400mm x 400mm x 550mm

400mm x 400mm x 550mm

680mm x 530mm x 550mm

Weight

30 kg

35 kg

40 kg

Power

220V, 50 - 60 Hz

Chuck

Size & Rotation

4" & 360°

6" & 360°

6" & 360V

XY Range

4"

4"

6"

Resolution

10 μm

Sample fixed mode

Vacuum adsorption

Electrical design

Electrical floating with banana plug adapters, can be used as backside electrode

Platen

U Shape

6 micropositioners

8 micropositioners

Microscope

Moving range

360°, 50.8 mm

Magnification

16 - 100X standard, 200X optional

CCD Pixel

50W (analog) / 200W (digital) / 500W (digital)

Micropositioning

XYZ Range

12 mm x 12 mm x 12 mm

Mechanical resolution

10 μm, 2 μm, 0.7 μm

Current leakage accuracy

10 pA, 100 fA

Cable connectors

Banana head / Alligator clip / Coaxial / Triaxial

Optional Accessories

Hot chuck

Coaxial / Triaxial chuck

Low current / capacitance testing

Shielding box

Vertical fine adjustment

Integral sphere integration

Special adapter

Rotation fine adjustment

Fixture for fiber optic coupler testing

Vibration free table

Light intensity / wavelength testing

Fixture for PCB/IC testing

Gold-plated chuck

RF testing accessories

Active probe

Application

IC / LD / LED / PD /PCB/ Packaged device / RF testing

PSM MINIATURE ANALYTICAL PROBE STATION


 

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